Recently, defect detection systems using artificial intelligence (AI) sensor data have been installed in smart factory manufacturing sites. However, when the manufacturing process changes due to ...

A research team affiliated with UNIST has unveiled an innovative, high-precision AI-powered quality inspection system that reduces inspection time from 12 minutes to just under 3 seconds. This cutting ...

Researchers built an AI system that adapts to process changes, maintaining defect detection accuracy and lowering retraining costs in smart factories. (Nanowerk News) Artificial intelligence is ...

KLA (NasdaqGS:KLAC) is reporting strong and sustained market share gains in semiconductor inspection equipment. These gains are linked to its leading edge inspection technology and industry leading ...

The 2026 SPIE Advanced Lithography + Patterning conference highlighted AI, both as a challenge and a solution. A case in point was the opening ...

At the 2025 PDF Solutions Users Conference, CEO John Kibarian delivered a wide-ranging keynote that positioned the semiconductor industry at a pivotal inflection point, one driven by explosive AI ...