Advanced machine learning is beginning to make inroads into yield enhancement methodology as fabs and equipment makers seek to identify defectivity patterns in wafer images with greater accuracy and ...

Researchers have developed a new method for detecting defects in additively manufactured components. Researchers at the University of Illinois Urbana-Champaign have developed a new method for ...

Researchers have tested eight stand-alone deep learning methods for PV cell fault detection and have found that their accuracy was as high as 73%. All methods were trained and tested on the ELPV ...

In the context of a continually growing global population and rising food demand, fruit, as an important source of nutrition, requires quality grading and efficient processing, which are critical ...

Few technologies today are as disruptive or show as much potential as artificial intelligence. AI is everywhere, from your phone to factory floors, and it can take many different forms. One of the ...