At-speed testing and delay defect analysis have become increasingly critical in ensuring the reliability and performance of modern integrated circuits. As circuit complexity grows alongside rapid ...

Detecting macro-defects early in the wafer processing flow is vital for yield and process improvement, and it is driving innovations in both inspection techniques and wafer test map analysis. At the ...

With every process node advance, new types of manufacturing defects manifest. These defects are especially prevalent during the early phase. For early adopters, silicon manufacturing tests must evolve ...

Relying solely on end-of-line testing isn't enough when security, traceability, and mission reliability are vital.

The decision to change from a functional to a structural test methodology is a far-reaching one. Functional test vectors are meant to check for correct device functionality. Structural test vectors ...

The industry buzz on zero defect initiatives is growing, and semiconductor manufacturers are throwing resources at the challenge in order to satisfy their automotive customers. As the amount of ...

There is an expectation from consumers that today’s electronic products will just work and that electronic manufacturers have continued to improve the quality of their products. In most cases, this ...

AI-powered test automation is redefining software reliability by reducing flaky tests, expanding coverage, and accelerating ...

Whether you call it test automation, automated testing, or something else, using software tools to help speed up the execution of software testing is an essential element of successful software ...