A new technical paper titled “Defect Analysis and Built-In-Self-Test for Chiplet Interconnects in Fan-out Wafer-Level Packaging” was published by researchers at Arizona State University. “Fan-out ...

At-speed testing and delay defect analysis have become increasingly critical in ensuring the reliability and performance of modern integrated circuits. As circuit complexity grows alongside rapid ...

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IMDEA Software researchers Facundo Molina, Juan Manuel Copia and Alessandra Gorla present FIXCHECK, a novel approach to improve patch fix analysis that combines static analysis, randomized testing and ...

SoftJin, a provider of Customized Automation software for Electronic Design and Manufacturing, announces NxDAT, software for efficient Analysis of Defects identified by Mask Inspection Systems. The ...

The approach toward software testing has drastically changed over the years. It has changed from manual testing to automation frameworks and now to AI-based testing. It isn’t just about increasing ...

Automated optical inspection (AOI) is a cornerstone in semiconductor manufacturing, assembly and testing facilities, and as such, it plays a crucial role in yield management and process control.

I recently had to update my password on a site that I joined many, many years ago -- far enough in the past that a "good enough" password was "any five characters." The site now wanted me to have a ...

Solid rocket motors (SRMs), extensively used in aerospace and missile systems, employ CFRP composites in motor casings due to their superior mechanical properties. However, the bonding interface ...